2024年IEEE第42届VLSI测试研讨会

2024年IEEE第42届VLSI测试研讨会（VTS 2024）

2024年4月22-24日

美国，亚利桑那州，坦佩

https://tttc-vts.org/public_html/new/2024/

该会议包括主题演讲、科学论文演示、简短的工业应用论文演示、特别会议和创新实践会议。

General Chairs:

Sule Ozev

Arizona State University

Email: SuleOzev@asu.edu

Mehdi Tahoori

Karlsruhe Institute of Technology

Email: mehdi.tahoori@kit.edu

Program Chairs:

Naghmeh Karimi

University of Maryland, Baltimore County

Email: naghmeh.karimi@umbc.edu

Jennifer Dworak

Southern Methodist University

Email: jdworak@mail.smu.edu

征稿主题：

Analog – Mixed-Signal – RF Test

ATPG & Compression

Silicon Debug

Automotive Test & Safety

Built-In Self-Test (BIST)

Defect & Current Based Test

Defect & Fault Tolerance

Delay & Performance Test

Design for Testability – Yield or Reliability

Pre-silicon Design Verification & Validation

Post-silicon Validation

Hardware Security

Embedded System & Board Test

Embedded Test Methods

Emerging Technologies Test and Reliability

Fault Modeling and Simulation

Low-Power IC Test

Functional safety and test methods to ensure functional safety

Machine Learning in Test – Yield and Reliability

Microsystems/MEMS/Sensors Test

Memory Test and Repair

2.5D – 3D & SiP Test

Yield Optimization

On-Line Test & Error Correction

Power & Thermal Issues in Test

System-on-Chip (SOC) Test

Test & Reliability of Biomedical Devices

Test & Reliability of High-Speed I/O

Test & Reliability of Machine Learning Systems

Test Quality & Reliability

Test Standards & Economics

Test Resource Partitioning

Transient & Soft Errors

FPGA Test