学术会议会议详情

VTS 2024

2024年IEEE第42届VLSI测试研讨会（VTS 2024）

# 计算机科学与信息技术# 计算机科学与技术

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Ei CompendexScopus

会议邮箱[email protected]

截稿日期2024.03.05

会议日期2024.04.22 - 04.24

官网地址

https://tttc-vts.org/public_html/new/2024/

会议地点美国亚利桑那州，坦佩

截稿倒计时：

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1054

BRIEF INTRODUCTION

会议简介

NO.1

该会议包括主题演讲、科学论文演示、简短的工业应用论文演示、特别会议和创新实践会议。

HIGHLIGHTS

重要信息

NO.2

出版信息: 组委会信息: General Chairs: Sule Ozev, Mehdi Tahoori Program Chairs: Naghmeh Karimi, Jennifer Dworak

CALL FOR PAPERS

征稿主题

NO.3

主题：

Analog – Mixed-Signal – RF Test
ATPG & Compression
Silicon Debug
Automotive Test & Safety
Built-In Self-Test (BIST)
Defect & Current Based Test
Defect & Fault Tolerance
Delay & Performance Test
Design for Testability – Yield or Reliability
Pre-silicon Design Verification & Validation
Post-silicon Validation
Hardware Security
Embedded System & Board Test
Embedded Test Methods
Emerging Technologies Test and Reliability
Fault Modeling and Simulation
Low-Power IC Test
Functional safety and test methods to ensure functional safety
Machine Learning in Test – Yield and Reliability
Microsystems/MEMS/Sensors Test
Memory Test and Repair
2.5D – 3D & SiP Test
Yield Optimization
On-Line Test & Error Correction
Power & Thermal Issues in Test
System-on-Chip (SOC) Test
Test & Reliability of Biomedical Devices
Test & Reliability of High-Speed I/O
Test & Reliability of Machine Learning Systems
Test Quality & Reliability
Test Standards & Economics
Test Resource Partitioning
Transient & Soft Errors
FPGA Test

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